Vita

• 1995 Abitur am Staatlichen Gymnasium am Römerkastell in Bad Kreuznach
• 1995-1996 Wehrdienst 2. RakArtLehrBtl. 52, Klotzbergkaserne in Idar-Oberstein
• 1996-2001 Studium der Elektrotechnik mit Vertiefungsrichtung Nachrichtentechnik an der TU Kaiserslautern
• 2001-2005 Wissenschaftlicher Mitarbeiter mit Anstellung zur Promotion an der TU Kaiserslautern am Lehrstuhl für „Theoretische Elektrotechnik und Optische Kommunikationstechnik“
• 2006 Erhalt der Doktorwürde. Titel der Dissertation: „Modellierung und Messtechnik von Ultrakurzimpuls-Raman-Faserverstärkern“
• 2006-2016 Wissenschaftlicher Mitarbeiter am Fraunhofer-Institut für Physikalische Messtechnik IPM in Freiburg im Breisgau in der Abteilung „Materialcharakterisierung und -prüfung“
• 2017 Wissenschaftlicher Mitarbeiter am Fraunhofer-Institut für Techno- und Wirtschaftsmathematik ITWM in Kaiserslautern im „Zentrum für Materialcharakterisierung und –prüfung“ in Kaiserslautern
• 2012-2017 Gruppenleiter der Gruppe „Optische Terahertz-Messtechnik“
• 2017-dato Professor für die Lehrgebiete Nachrichtentechnik, Digitale Signalverarbeitung und Terahertz-Technologie im Fachbereich 2 – Technik, Informatik und Wirtschaft der Technischen Hochschule Bingen

Funktionen

• Mitglied im Programmkomitee der weltgrößten Photonik-Konferenz, der „SPIE PhotonicsWest“ in San Francisco, CA, USA

Arbeitsgebiete

• Schichtdickenmessung mittels Terahertz-Zeitbereichspektroskopie

Lehre

Im Wintersemester:

• DIÜT: Digitale Übertragungstechnik (BA)
• EGRU2: Grundlagen der Elektrotechnik 2 (BA)
• OPTÜ: Optische Übertragungstechnik (MA)
• THZ: Terahertz-Technologie (MA)

Im Sommersemester:

• ANÜT: Analoge Übertragungstechnik (BA)
• BWEK: Basiswissen Energie- und Kommunikationstechnik (BA)
• DISI: Digitale Signalverarbeitung (BA)
• EGRU1: Grundlagen der Elektrotechnik 1 (BA)
• INCO: Informationstheorie und Codierung (MA)

Preise und Auszeichnungen

•  1999 VDE Preis für das beste Vordiplom im Fachbereich Elektro- und Informationstechnik der TU Kaiserslautern 1998
• 2002 VDE Preis für das beste Diplom im Fachbereich Elektro- und Informationstechnik der TU Kaiserslautern 2001
• 2002 Auszeichnung der Diplomarbeit durch die Stadt-Sparkasse Kaiserslautern
• 2013 Exzellenz-Auszeichnung der Fraunhofer-Gesellschaft, München

Publikationen, Fachvorträge und Fachartikel

Wissenschaftliche Veröffentlichungen

• "Interferometry-aided terahertz time-domain spectroscopy", D. Molter, M. Trierweiler, F. Ellrich, J. Jonuscheit, G. von Freymann. Vol. 25, No. 7 | 3 Apr 2017 | OPTICS EXPRESS 7547, https://doi.org/10.1364/OE.25.007547 (2017)
• "Influence of Substrate Material on Radiation Characteristics of THz Photoconductive Emitters", J. Klier, G. Torosyan, N. S. Schreiner, D. Molter, F. Ellrich, W. Zouaghi, E. Peytavit, J.-F. Lampin, R. Beigang, J. Jonuscheit, and G. von Freymann. International Journal of Antennas and Propagation, Vol. 2015, Article ID 540175, 7 pages, 2015
• "Fiber-coupled terahertz time-domain spectroscopy (THz-TDS) systems", M. Theuer, F. Ellrich, D. Molter and, R. Beigang. In Handbook of Terahertz Technology for Imaging, Sensing, and Communications, Edited by Daryoosh Saeedkia, Woodhead Publishing Ltd, WPEO 34, pp. 295-326, 2013
• "Unsichtbares sichtbar machen – Versteckte Substanzen mittels Terahertz-Spektroskopie identifizieren", J. Jonuscheit, D. Molter, F. Ellrich, R. Beigang, F. Platte, and K. Nalpantidis. In Photonik 6/2012, pp. 58-61, 2012
• "Berührungslose Mehrlagen-Schichtdickenmessung industrieller Beschichtungen mittels THz-Messtechnik (Contact-Free Multilayer Thickness Determination of Industrial Coatings Using THz Measuring Techniques)", V. K. S. Feige, M. Berta, S. Nix, F. Ellrich, J. Jonuscheit, and R. Beigang. tm-Technisches Messen: Vol. 79, No. 2, pp. 87-94, 2012
• "Compact fiber-coupled terahertz spectroscopy system pumped at 800 nm wavelength", F. Ellrich, T. Weinland, D. Molter, J. Jonuscheit, and R. Beigang. Rev. Sci. Instrum., Vol 82, pp. 053102, 2011
• "High-speed terahertz time-domain spectroscopy of cyclotron resonance in pulsed magnetic field", D. Molter, F. Ellrich, T. Weinland, S. George, M. Goiran, F. Keilmann, R. Beigang, and J. Léotin, Optics Express, Vol. 18, Issue 25, pp. 26163-26168, 2010
• "Terahertz-Wellen – ein neuer Spektralbereich für die industrielle Messtechnik (Terahertz Waves – A New Spectral Band for Industrial Measurement Techniques)“, F. Ellrich, T. Weinland, J. Klier, J. Jonuscheit, and R. Beigang, tm-Technisches Messen, Vol. 77, No. 9, p. 452-461, 2010
• "Fasergekoppeltes Terahertz-Spektroskopiesystem (Fiber-coupled Terahertz Spectroscopy System)", F. Ellrich, T. Weinland, M. Theuer, J. Jonuscheit, and R. Beigang, tm-Technisches Messen, Vol. 75, No. 1, p. 14-22, 2008
• "Terahertz-Bildgebung in industriellen Anwendungen (Terahertz Imaging in Industrial Applications)", M. Theuer, G. Torosyan, F. Ellrich, J. Jonuscheit, and R. Beigang, tm-Technisches Messen, Vol. 75, No. 1, p. 64-70, 2008

Beiträge zu nationalen und internationalen Konferenzen und Workshops

• “Influence of bandwidth and dynamic range on layerthickness determination using terahertz time-domain spectroscopy,”, L. Liebelt, S. Weber, J. Klier, T. Pfeiffer, D. Molter, F. Ellrich, G. von Freymann. FTGC2019 – French-German Terahertz Conference 2019, Kaiserslautern, Germany, April 2-5, 2019
• “Different evaluation techniques for layer thickness determination using terahertz time-of-flight measurements,”, F. Ellrich, L. Liebelt, J. Klier, S. Weber, D. Molter, J. Jonuscheit, and G. von Freymann. SPIE - Photonics West [10531-23], San Francisco, CA, USA, February 6th, 2019
• “Enhancing terahertz multilayer thickness measurements by interferometric methods”, T. Pfeiffer, J. Klier, S. Weber, D. Molter, F. Ellrich, J. Jonuscheit, and G. von Freymann. SPIE - Photonics West [10917-85], San Francisco, CA, USA, February 6th, 2019
• “Four-channel terahertz time-domain spectroscopy system for industrial pipe inspection”, J. Klier, D. Kharik, W. Zwetow, D. Gundacker, S. Weber, D. Molter, F. Ellrich, J. Jonuscheit, and G. von Freymann. The 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, Japan, September 9-14, 2018
• “Interferometry-aided terahertz time-domain spectroscopy for robust measurements in reflection”, D. Molter, S. Weber, T. Pfeiffer, J. Klier, S. Bachtler, F. Ellrich, J. Jonuscheit, and G. von Freymann. The 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Nagoya, Japan, September 9-14, 2018
• “Quad-channel TDS system for industrial pipe inspection”, J. Klier, D. Kharik, W. Zwetow, D. Gundacker, S. Weber, D. Molter, F. Ellrich, J. Jonuscheit and G. von Freymann, SPIE – Optics and Photonics [10756-36], San Diego, CA, USA, August 19-23, 2018
• “Comparison of different evaluation methods for layer thickness using terahertz time-domain spectroscopy”, L. Liebelt, F. Ellrich, S. Weber, J. Klier, D. Molter, J. Jonuscheit and G. von Freymann, SPIE – Optics and Photonics [10756-35], San Diego, CA, USA, August 19-23, 2018
• “Fiber-coupled THz systems for industrial applications”, [invited], F. Ellrich, J. Klier, S. Weber, M. Kolano, T. Pfeiffer, D. Molter, J. Jonuscheit, and G. von Freymann. SPIE – Optics and Photonics [10756-13], San Diego, CA, USA, August 19-23, 2018
• “Comparison of different evaluation methods for layer thickness determination using terahertz time-of-flight measurements”, L. Liebelt, F. Ellrich, S. Weber, J. Klier, D. Molter, J. Jonuscheit and G. von Freymann, 8th Workshop on Terahertz Technology - International Forum on Terahertz Spectroscopy and Imaging, Kaiserslautern, Germany, March 20-21, 2018
• “Self-Programming Painting Cell »SelfPaint«”, S. Weber, J. Klier, C. Kaiser, D. Molter, F. Ellrich, S. Paustian, N. Güttler, O. Tiedje, F. Edelvik, N. Sandgren, J. Jonuscheit and G. von Freymann, 8th Workshop on Terahertz Technology - International Forum on Terahertz Spectroscopy and Imaging, Kaiserslautern, Germany, March 20-21, 2018
• “Multichannel TDS system for industrial pipe inspection”, J. Klier, D. Kharik, W. Zwetow, D. Gundacker, S. Weber, D. Molter, F. Ellrich, J. Jonuscheit and G. von Freymann, 8th Workshop on Terahertz Technology - International Forum on Terahertz Spectroscopy and Imaging, Kaiserslautern, Germany, March 20-21, 2018
• “Vibration compensation for layer thickness measurements in industrial environments”, D. Molter, S. Weber, T. Pfeiffer, J. Klier, S. Bachtler, F. Ellrich, J. Jonuscheit and G. von Freymann, 8th Workshop on Terahertz Technology - International Forum on Terahertz Spectroscopy and Imaging, Kaiserslautern, Germany, March 20-21, 2018
• “Terahertz thickness determination for industrial applications: Challenges and solutions”, [keynote], F. Ellrich, J. Klier, S. Weber, D. Molter, J. Jonuscheit, and G. von Freymann. SPIE - Photonics West [10531-23], San Francisco, CA, USA, January 30th, 2018
• "Mit Sicherheit Terahertz – eine neue Technologie auf dem Vormarsch", [invited], F. Ellrich. VfS – Verein für Sicherheitstechnik e.V. – Fachtagung Forensik XV, Dresden, 24. Januar, 2018
• “All-Polarization-Maintaining, Polarization-Multiplexed, Gain-Coupled, Mode-Locked Fiber Laser”, M. Kolano, B. Gräf, D. Molter, F. Ellrich, and G. von Freymann. Advanced Solid State Lasers Conference – ASSL, Nagoya, Aichi, Japan, October 2-5, 2017
• “Thickness determination of wet coatings using self-calibration method”, S. Weber, J. Klier, F. Ellrich, S. Paustian, N. Güttler, O. Tiedje, J. Jonuscheit, and G. von Freymann. The 42nd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Cancun, Mexico, August 27th - September 1st, 2017
• “Thickness determination of wet coatings using self-calibration method”, F. Ellrich, J. Klier, S. Weber, J. Jonuscheit, and G. von Freymann. SPIE - Photonics West [10103-25], San Francisco, CA, USA, January 31st, 2017
• “Improvement of terahertz time-domain spectroscopy precision by interferometrically-tracked delay lines”, D. Molter, M. Trierweiler, F. Ellrich, J. Jonuscheit, and G. von Freymann. SPIE - Photonics West [10103-51], San Francisco, CA, USA, February 1st, 2017
• “Terahertz Time‐Domain Technology For Thickness Determination Of Industrial Relevant Multi‐Layer Coatings”, F. Ellrich, J. Klier, S. Weber, J. Jonuscheit, and G. von Freymann, The 41st International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Copenhagen, Denmark, September 25-30, 2016
• “Interferometry‐Aided Delay Lines For High‐Precision Terahertz Time‐Domain Spectroscopy”, D. Molter, M. Trierweiler, F. Ellrich, J. Jonuscheit, and G. von Freymann, The 41st International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Copenhagen, Denmark, September 25-30, 2016
• “Polarization-Multiplexed, Mode-Locked Fiber Laser”, M. Kolano, B. Gräf, D. Molter, F. Ellrich, and G. von Freymann, 7th EPS-QEOD EUROPHOTON CONFERENCE
• "Solid State, Fibre, and Waveguide Coherent Light Sources", Vienna, Austria, August 21-26, 2016
• “All-Polarization-Maintaining, Polarization-Multiplexed, Dual-Frequency, Mode-Locked Fiber Laser”, M. Kolano, B. Gräf, D. Molter, F. Ellrich, and G. von Freymann, CLEO: Conference on Lasers and Electro-Optics, OSA Technical Digest, Optical Society of America, San Jose, CA, USA, June, 5-10, 2016
• “Thickness Measurements in the Automotive Industry”, J. Klier, S. Krimi, F. Ellrich, J. Jonuscheit and G. von Freymann, 7th Workshop on Terahertz Technology - International Forum on Terahertz Spectroscopy and Imaging, Kaiserslautern, Germany, March 15-16, 2016
• "Multilayer thickness measurement technique based on terahertz time-domain technology for industrial purposes", Invited Paper, F. Ellrich, J. Klier, S. Krimi, J. Jonuscheit, and G. von Freymann. SPIE - Photonics West [9747-5], San Francisco, CA, USA, February 15th, 2016
• "Terahertz imaging and spectroscopy for detection and identification of drugs and explosives in letters and small packages", Invited Paper, F. Ellrich, D. Molter, J. Jonuscheit, and G. von Freymann, M. Schubert, D. Hübsch, and T. Sprenger, SPIE Photonics West [9747-35], San Francisco, CA, USA, February 17th, 2016
• "Terahertz detection of explosive materials and dangerous objects”, N. Palka, M. Kowalski, M. Walczakowski, M. Szustakowski, W. Ciurapinski, J. Wrobel, L. Jodlowski, E. Rurka, J. B. Sleiman, P. Mounaix, F. Ellrich, D. Molter, J. Jonuscheit, G. von Freymann, and R. Beigang , NATO ARW on THz Diagnostics of CBRN effects and Detection of Explosives & CBRN, Izmir, Turkey, November, 2015
• "An Evolutionary Algorithm based Approach to Improve the Limits of Minimum Thickness Measurements of Multilayered Automotive Paints", S. Krimi, J. Klier, J. Jonuscheit, R. Beigang, R. Urbansky, Frank Ellrich, and G. von Freymann. The 40th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Hongkong, China, August 24-28, 2015
• "Multiple-Angle Approach for Enhanced Terahertz Spectroscopic Pattern Recognition", F. Ellrich, D. Molter, S. Krimi, J. Jonuscheit, and G. von Freymann, F. Platte and K. Nalpantidis, D. Hübsch and T. Würschmidt, T. Sprenger. SPIE - Photonics West [9362-30], San Francisco, CA, USA, February 12, 2015  
• "Improved Substance Identification by Suppression of Multiple-Reflection-Induced Spectral Noise", F. Ellrich, D. Molter, S. Krimi, J. Jonuscheit, G. von Freymann, D. Hübsch, T. Würschmidt, T. Sprenger, F. Platte, C. Fredebeul, and K. Nalpantidis. The 39th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Tucson, AZ, USA, September 14-19, 2014
• "Terahertz Spectroscopy - A Powerful Tool for Substance Identification", F. Ellrich, D. Molter, J. Jonuscheit, R. Beigang, and G. von Freymann, Invited Paper, International Conference on Laser Applications in Life Sciences (LALS), Ulm, Germany, July 2, 2014
• “Multi-step pattern-recognition: A powerful tool for substance identification based on real-world terahertz-spectra”, F. Ellrich, D. Molter, J. Jonuscheit, G. von Freymann, R. Beigang, F. Platte, K. Nalpantidis, T. Sprenger and D. Hübsch, CLEO: Conference on Lasers and Electro-Optics, OSA Technical Digest, Optical Society of America, San Jose, CA, USA, June 8-13, 2014
• "Comparison of terahertz technologies for detection and identification of explosives", R. Beigang, S. G. Biedron, S. Dyjak, F. Ellrich, M. W. Haakestad, D. Hübsch, T. Kartaloglu, E. Ozbay, F. Ospald, N. Palka, U. Puc, E. Czerwińska, A. B. Sahin, A. Sešek, J. Trontelj, A. Švigelj, H. Altan, A. D. van Rheenen, M. Walczakowski. Proc. SPIE 9102, Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense, 91020C, doi:10.1117/12.2050367; Baltimore, Maryland, USA, May 21, 2014
• "Innovative evaluation methods for terahertz-spectra by combining different chemometric tools", F. Ellrich, D. Molter, J. Jonuscheit, G. von Freymann and R. Beigang, F. Platte and K. Nalpantidis, T. Sprenger, D. Hübsch and T. Würschmidt. SPIE - Photonics West [8985-23], San Francisco, CA, USA, February 5th, 2014
• "Moderne Postkontrolle in der JVA – Neue Technologien zur Drogen- und Sprengstoffdetektion", F. Ellrich. VfS – Verein für Sicherheitstechnik e.V. – Fachtagung Sicherheit in der JVA VII, 4. Dezember, 2013
• "Automated detection and identification of illegal drugs and explosives using terahertz time domain spectroscopy", R. Beigang, F. Ellrich, D. Molter and J. Jonuscheit, F. Platte and K. Nalpantidis, T. Sprenger, D. Hübsch, and T. Würschmidt. SPIE-Europe DSS, Dresden, Germany, September 23-26, 2013
• "Risiko-Post durch Terahertz-Technologie erkennen", F. Ellrich. 6. Poststellenleitertag, Würzburg, Deutschland, 7. Mai, 2013 "Chemometric Tools for Analysing Terahertz Fingerprints in a Postscanner", F. Ellrich, G. Torosyan, S. Wohnsiedler, S. Bachtler, A. Hachimi, J. Jonuscheit, R. Beigang, F. Platte, K. Nalpantidis, T. Sprenger, and D. Hübsch. The 37th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Wollongong, Australia, September 23-28, 2012
• "All-solid-state THz ATR spectroscopy module", D. Molter, G. Torosyan, J. Klier, C. Matheis, C. Petermann, S. Weber, F. Ellrich, J. Jonuscheit, and R. Beigang. 3rd EOS Topical Meeting on Terahertz Science & Technology (TST 2012), Prague, Czech Republic, June 17-20, 2012
• "Evaluation of terahertz spectra using chemometric methods", J. Jonuscheit, G. Torosyan, F. Ellrich, S. Wohnsiedler, M. Herrmann, R. Beigang, F. Platte, K. Nalpantidis, M. Heise, T. Sprenger, H. Wolf. SPIE Defense Security&Sensing, Baltimore, Maryland, USA, April 23-27, 2012
• "Der Terahertz-Postscanner – Neue Technologien zur Sprengstoff- und Drogendetektion", F. Ellrich. 44. Jahrestagung VSW – Vereinigung für die Sicherheit der Wirtschaft e. V., Mainz, Deutschland, 7. März, 2012
• "Terahertz time-domain magneto-optics in pulsed magnetic fields", D. Molter, F. Ellrich, T. Weinland, S. George, M. Goiran, F. Keilmannd, R. Beigang, J. Léotin. 5th Workshop on Terahertz Technology - International Forum on Terahertz Spectroscopy and Imaging, Kaiserslautern, Germany, March 6-7, 2012
• "All-solid-state THz ATR spectroscopy module", D. Molter, G. Torosyan, J. Klier, C. Matheis, C. Petermann, S. Weber, F. Ellrich, J. Jonuscheit, and R. Beigang. 5th Workshop on Terahertz Technology - International Forum on Terahertz Spectroscopy and Imaging, Kaiserslautern, Germany, March 6-7, 2012
• "Chemometric methods for the evaluation of Terahertz spectra in a mail screening system", J. Jonuscheit, G. Torosyan, F. Ellrich, S. Wohnsiedler, M. Herrmann, R. Beigang, F. Platte, K. Nalpantidis, M. Heise, T. Sprenger, and H. Wolf. 5th Workshop on Terahertz Technology - International Forum on Terahertz Spectroscopy and Imaging, Kaiserslautern, Germany, March 6-7, 2012
• "Evaluation of terahertz spectra using chemometric methods",J. Jonuscheit, G. Torosyan, F. Ellrich, S. Wohnsiedler, M. Herrmann, R. Beigang, F. Platte, K. Nalpantidis, M. Heise, T. Sprenger, and H. Wolf. SPIE Photonics West, San Francisco, California, USA, February 2-7, 2012
• "Terahertz time-domain magneto-optics using pulsed magnetic fields", D. Molter, F. Ellrich, T. Weinland, S. George, M. Goiran, F. Keilmann, R. Beigang, and J. Léotin. The 36th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Houston, TX, USA, October 2-7, 2011
• "Handheld miniature THz ATR module", D. Molter, G. Torosyan, J. Klier, C. Matheis, C. Petermann, S. Weber, F. Ellrich, J. Jonuscheit, and R. Beigang. The 36th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Houston, TX, USA, October 2-7, 2011
• "Non-Contact Multilayer Thickness Measurements with Reflection-Mode Terahertz Time-Domain Spectroscopy", V. Feige, S. Nix, F. Ellrich, J. Jonuscheit, and R. Beigang, Conference on Lasers and Electro-Optics – European Quantum Electronics Conference 2011, Munich, Germany, May 22-26, 2011.
• "Time-resolved terahertz spectroscopy of cyclotron resonance in p-germanium in pulsed magnetic field", D. Molter, F. Ellrich, T. Weinland, S. George, M. Goiran, F. Keilmann, R. Beigang, and J. Léotin, International Workshop on Optical Terahertz Science and Technology (OTST), Santa Barbara, CA, USA, March 13-17, 2011
• "Terahertz Imaging for Non-Destructive Testing", J. Jonuscheit, R. Beigang, F. Ellrich, J. Klier, D. Molter, and M. Theuer. International Symposium on NDT in Aerospace, Hamburg, Germany, November 22-24, 2010
• "High-speed terahertz time-domain cyclotron resonance spectroscopy in pulsed magnetic field", D. Molter, F. Ellrich, T. Weinland, S. George, M. Goiran, F. Keilmann, R. Beigang, and J. Léotin, French-German Research: 50 Years In The Light Of The Laser, Berlin, Germany, November 5-6, 2010
• "Terahertz Wellen – ein weißer Fleck macht Karriere", F. Ellrich, Ehrensymposium – 50 Jahre Laser, Freiburg, Germany, 16th September, 2010 "Angle-Resolved THz Time Domain Reflection Spectroscopy of Rough Surfaces", C. Robiné, C. Wiegand, K. Rühle, F. Ellrich, T. Weinland, and R. Beigang, CLEO/QELS: 2010 Laser Science to Photonic Applications, San Jose, CA, USA, May 16 – 21, 2010
• "Terahertz Technik für die industrielle Anwendung", Jonuscheit, R. Beigang, F. Ellrich, and D. Molter. DGZfP-Jahrestagung 2010, Erfurt, Deutschland, May 10-12, 2010
• "Quality Inspection using Terahertz Time Domain Spectroscopy", F. Ellrich, D. Molter, G. Torosyan, M. Theuer, J. Jonuscheit, and R. Beigang, 4th Workshop on Terahertz Technology - International Forum on Terahertz Spectroscopy and Imaging, Kaiserslautern, Germany, March 2-3, 2010
• "Terahertz Time Domain Spectroscopy for Nondestructive Testing and Sensing Applications", F. Ellrich, M. Herrmann, J. Jonuscheit, M. Theuer, G. Torosyan, D. Molter, S. Wiegand, S. Wohnsiedler, and R. Beigang, Laser Applications to Chemical, Security and Environmental Analysis (LACSEA), San Diego, CA, USA, 3rd February 2010
• "Industrial Application of Terahertz Imaging: Non-Destructive Inspection of Thin Films and Ceramics", F. Ellrich, M. Theuer, D. Molter, M. Kannengießer, J. Jonuscheit, and R. Beigang, International Workshop on Terahertz Technology, Osaka University Nakanoshima Center, Osaka, Japan, 30th November – 3rd December 2009
• "Terahertz imaging for non-destructive testing", J. Jonuscheit, M. Theuer, F. Ellrich, D. Molter, and R. Beigang, 5th ESA Workshop on Millimetre Wave Technology and Applications & 31st ESA Antenna Workshop, Noordwijk, The Netherlands, May 18-20, 2009
• "Terahertz Technik zur kontaktlosen und berührungsfreien Prüfung von Keramiken und dünnen Schichten", J. Jonuscheit, R. Beigang, F. Ellrich und C. Wiegand, DGZfP-Jahrestagung 2009, Münster, Germany, May 18-20, 2009
• "Fasergekoppeltes Terahertz-Spektroskopiesystem", T. Weinland, F. Ellrich, D. Molter, und R. Beigang, DPG Frühjahrstagung, Hamburg, Germany, March 2-6, 2009
• "Terahertz Imaging for Non-Destructive Testing", J. Jonuscheit, M. Theuer, G. Torosyan, F. Ellrich, and R. Beigang. International Symposium on NDT in Aerospace, Fürth, Germany, December 3-5, 2008
• "Experimental Investigation and Simulation of THz Surface Emission Characteristics", M. Theuer, C. Imhof, G. Torosyan, F. Ellrich, R. Zengerle, and R. Beigang, EOS Annual Meeting 2008, Paris, France, 29th September 2008 - 2nd October, 2008
• "Fast Scanning 200 Hz Fiber-coupled Terahertz Time Domain Spectroscopy System", F. Ellrich, D. Molter, T. Weinland, M. Theuer, J. Jonuscheit, and R. Beigang, EOS Annual Meeting 2008, Paris, France, 29th September 2008 - 2nd October, 2008
• "Thin-Film Measurements with Ultra Short THz Pulses", F. Ellrich, M. Theuer, G. Torosyan, J. Jonuscheit, and R. Beigang, EOS Annual Meeting 2008, Paris, France, 29th September 2008 - 2nd October, 2008
• "200 Hz Rapid Scan Fiber-coupled Terahertz Time Domain Spectroscopy System", F. Ellrich, D. Molter, T. Weinland, M. Theuer, J. Jonuscheit, and R. Beigang, 33rd International Conference on Infrared and Millimeter Waves and 16th International Conference on Terahertz Electronics (IRMMW-THz2008), Pasadena, CA, USA, September 15-19, 2008
• "Thin-Film Measurements with THz-Radiation", F. Ellrich, M. Theuer, G. Torosyan, J. Jonuscheit, and R. Beigang, 33rd International Conference on Infrared and Millimeter Waves and 16th International Conference on Terahertz Electronics (IRMMW-THz2008), Pasadena, CA, USA, September 15-19, 2008
• "Pump beam diameter dependent terahertz generation from surface emitters - experiment and simulation", M. Theuer, C. Imhof, G. Torosyan, F. Ellrich, R. Zengerle, and R. Beigang, 33rd International Conference on Infrared and Millimeter Waves and 16th International Conference on Terahertz Electronics (IRMMW-THz2008), Pasadena, CA, USA, September 15-19, 2008
• "THz Imaging and Spectroscopy for Nondestructive Testing", R. Beigang, M. Theuer, F. Ellrich, G. Torosyan, and J. Jonuscheit, XXIX URSI General Assembly, Chicago, IL, USA, August 17-16, 2008
• "Terahertz-Messtechnik für die zerstörungsfreie Werkstoffprüfung: Möglichkeiten und Grenzen der THz-Messtechnik", R. Beigang, F. Ellrich, G. Torosyan, and M. Theuer, ITG, VDI/VDE, GMA, Sensoren und Messsysteme 2008: 14. Fachtagung Ludwigsburg, Germany, March 11-12, 2008
• "Fiber-Coupled THz TDS System", F. Ellrich, T. Weinland, M. Theuer, J. Jonuscheit, and R. Beigang, 3rd Workshop on Terahertz Technology - International Forum on Terahertz Spectroscopy and Imaging, Kaiserslautern, Germany, March 4-5, 2008
• "THz Imaging for Non-Destructive Testing", M. Theuer, G. Torosyan, F. Ellrich, J. Jonuscheit, and R. Beigang, 3rd Workshop on Terahertz Technology - International Forum on Terahertz Spectroscopy and Imaging, Kaiserslautern, Germany, March 4-5, 2008
• "Broadband Optical Fiber Amplifiers", F. Ellrich and R. Zengerle, Second Joint Symposium on Opto- & Microelectronic Devices and Circuits SODC 2002, Stuttgart, Germany, March 10-16, 2002 

Patente

• „Räumliche Entscheidungs- und Auswertelogik bei der Erkennung von Gefahrenstoffen anhand spektraler Informationen“, DE102014101302B3, erteilt am 23.10.2015
• „Interferogramm-gestützte Terahertz-Zeitbereichsspektroskopie“, DE102014105751B3, erteilt am 13.05.2015
• „Mehrstufiger Frequenzkonverter mit wellenlängenselektiver Transmission“, DE102015107010.3, eingereicht am 05.05.2015
• „Kollimator für elektromagnetische Hochfrequenzstrahlung“, DE102013105789B3, erteilt am 13.11.2014
• „Anordnung und Verfahren zur Unterdrückung von Störinformationen bei der spektroskopischen Identifikation von verpackten Substanzen“, DE102014113354.4, eingereicht am 16.09.2014
• „Anordnung und Verfahren zur Trennung von Nutz- und Störinformationen im Terahertz-optischen Spektralbereich“, DE102014100662.3, erteilt am 21.01.2014